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Towards Accountability in Machine Learning Applications: A System-Testing Approach

ZEW Discussion Paper Nr. 22-001 // 2022
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ZEW Discussion Paper Nr. 22-001 // 2022

Towards Accountability in Machine Learning Applications: A System-Testing Approach

Zur Publikation

Wan, Wayne Xinwei und Thies Lindenthal (2022), Towards Accountability in Machine Learning Applications: A System-Testing Approach, ZEW Discussion Paper Nr. 22-001, Mannheim.

Autoren/-innen Wayne Xinwei Wan // Thies Lindenthal